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Check for Availabilityout of stock. Click on the button below to search for this title in other formats. Design, Automation, and Test in Europe Conference and Exhibition 2003: (proceedings : Munich, Germany, March 3-7, 2003 )
Synopses & ReviewsBook News Annotation:The two volumes of this proceedings (of the Design, Automation, and
Test in Europe Conference held in Munich, Germany in March 2003)
feature the designers' forum in v.1 and nearly 1200 pages of
proceedings in v.2. Among the topics of the designers' forum are
design case studies, embedded operating systems for SoC, design
methodologies, and analog and mixed signal methodology design. The
topics in v.2 include ambient intelligence vision, energy-efficient
memory systems, jitter and noise analysis for analog systems,
uncertainty, architectural level synthesis, and delay testing and
diagnosis.
Annotation (c)2003 Book News, Inc., Portland, OR (booknews.com) What Our Readers Are SayingBe the first to add a comment for a chance to win!Product Details
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