|
|
||
![]() |
||
| HELP | ||
|
This item may be
Check for Availabilityout of stock. Click on the button below to search for this title in other formats. Memory Technology, Design and Testing; Proceedings.by Tom Wik Et Al
Synopses & ReviewsPublisher Comments:Includes bibliographical references and author index.
Book News Annotation:This thin volume contains the proceedings of the July 2003 conference
in San Jose, California. It includes 13 papers on the following
topics: DRAM for leading edge applications; fault analysis, test
generation, and verification; enhanced testing techniques; memory
BIST challenges; memory roadmap, yield, and optimization; and memory
design techniques. Only authors appear in the index.
Annotation (c)2003 Book News, Inc., Portland, OR (booknews.com) What Our Readers Are SayingBe the first to add a comment for a chance to win!Product Details
| |||
|
| ||||
|
|
||||