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Memory Technology, Design and Testing; Proceedings.

by Tom Wik Et Al

Synopses & Reviews

Publisher Comments:

Includes bibliographical references and author index.

Book News Annotation:

This thin volume contains the proceedings of the July 2003 conference in San Jose, California. It includes 13 papers on the following topics: DRAM for leading edge applications; fault analysis, test generation, and verification; enhanced testing techniques; memory BIST challenges; memory roadmap, yield, and optimization; and memory design techniques. Only authors appear in the index. Annotation (c)2003 Book News, Inc., Portland, OR (booknews.com)

Product Details

ISBN:
9780769520049
Subtitle:
(records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing : 28-29 July, 2003, San Jose, California )
Publisher:
IEEE Computer Society
Location:
Los Alamitos, Calif.
Subject:
Semiconductor storage devices
Subject:
Random access memory.
Series Volume:
no. 69-13
Publication Date:
c2003
Illustrations:
Yes
Pages:
ix, 95 p.
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