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Other titles in the Materials Research Society Symposium Proceedings, series:
Materials Reliability in Microelectronics IIby C V Thompson
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Book News Annotation:
Proceedings of the San Francisco, Calif. symposium of April-May 1992, on stress and electromigration/modelling, microstructure, metallization for interconnects ..., oxide and device reliability, analytical techniques.
Annotation c. Book News, Inc., Portland, OR (booknews.com)
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
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