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Emily St. John Mandel: IMG Powell’s Q&A: Emily St. John Mandel



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Confocal Scanning Optical Microscopy and Related Imaging Systems

by

Confocal Scanning Optical Microscopy and Related Imaging Systems Cover

 

Synopses & Reviews

Publisher Comments:

This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given.

The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology.A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes.

Key Features

* Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers

* Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology

* Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations

* Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications

* Discusses the theory and design of near-field optical microscopes

* Explains phase imaging in the scanning optical and interference microscopes

Book News Annotation:

Introduces scientists and engineers to the field of scanning optical miscroscopy in order to overcome the problems associated with submicrometer imaging of complex 3D structures. Concentrates mainly on the confocal scanning optical microscope (CSOM), and the optical interference microscope (OIM), although it does discuss the theory and design of the near-field scanning optical microscope (NSOM). Covers practical aspects of building a CSOM or OIM, and considers the applications of these instruments to phase and biological imaging, semiconductor inspection, and metrology. Also contains a theoretical discussion of the depth and transverse resolution, emphasizing practical results of the theoretical calculations, and their uses in understanding the operation of the microscopes.
Annotation c. Book News, Inc., Portland, OR (booknews.com)

Synopsis:

esolution is included, with emphasis placed on the practical results of the theoretical calculations and their uses in understanding the operation of these microscopes.

Synopsis:

This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. These microscopes have been designed to overcome the problems associated with submicrometer imaging of complex three-dimensional structures. The book concentrates mainly on two of these instruments: the confocal scanning optical microscope (CSOM), and the optical interference microscope (OIM). In these instruments a defocused image disappears rather than blurs as it does in a standard microscope. As a result, researchers can visualize submicrometer structures, determine their surface profiles, and observe a selected cross section of transparent materials withut cutting the sample into thin slices. A comprehensive discussion of the theory and design of the near-field scanning optical microscope (NSOM) is also given.

The text also discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope and also considers the applications of these instruments to phase imaging, biological imaging, and semiconductor inspection and metrology. A comprehensive theoretical discussion of the depth and transverse resolution is included, with emphasis placed on the practical results of the theoretical calculations and their uses in understanding the operation of these microscopes.

Table of Contents

Introduction. Instruments. Depth and Transverse Resolution. Phase Imaging. Applications. Appendix A: Vector Field Theory for Depth and Transverse Resolution of a CSOM.

Product Details

ISBN:
9780124087507
Editor:
Corle, Timothy R.
Author:
Kino, Gordon S.
Author:
Corle, Timothy R.
Author:
Corle, Kino, Gordon, Timothy
Author:
Corle, Kino, Gordon S., Timothy R.
Publisher:
Academic Press
Location:
San Diego :
Subject:
Microscope and microscopy
Subject:
Optics
Subject:
Imaging Systems
Subject:
Microscopes & Microscopy
Subject:
Confocal microscopy
Subject:
Science Reference-Technology
Edition Description:
Includes bibliographical references and index.
Series Volume:
program 4
Publication Date:
19960931
Binding:
HARDCOVER
Language:
English
Illustrations:
Yes
Pages:
335
Dimensions:
9 x 6 in.

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Related Subjects

Reference » Science Reference » Microscopes
Reference » Science Reference » Technology
Science and Mathematics » Physics » Optics

Confocal Scanning Optical Microscopy and Related Imaging Systems New Hardcover
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$168.95 In Stock
Product details 335 pages Academic Press - English 9780124087507 Reviews:
"Synopsis" by , esolution is included, with emphasis placed on the practical results of the theoretical calculations and their uses in understanding the operation of these microscopes.
"Synopsis" by , This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. These microscopes have been designed to overcome the problems associated with submicrometer imaging of complex three-dimensional structures. The book concentrates mainly on two of these instruments: the confocal scanning optical microscope (CSOM), and the optical interference microscope (OIM). In these instruments a defocused image disappears rather than blurs as it does in a standard microscope. As a result, researchers can visualize submicrometer structures, determine their surface profiles, and observe a selected cross section of transparent materials withut cutting the sample into thin slices. A comprehensive discussion of the theory and design of the near-field scanning optical microscope (NSOM) is also given.

The text also discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope and also considers the applications of these instruments to phase imaging, biological imaging, and semiconductor inspection and metrology. A comprehensive theoretical discussion of the depth and transverse resolution is included, with emphasis placed on the practical results of the theoretical calculations and their uses in understanding the operation of these microscopes.

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