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Crystallographic Instrumentation

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Crystallographic Instrumentation Cover

 

Synopses & Reviews

Publisher Comments:

Innovations in crystallographic instrumentation and the rapid development of methods of diffraction measurement have led to a vast improvement in our ability to determine crystal and molecular structure. This up-to-date resource will allow the reader to harness the potential of X-ray diffraction instruments. Different sources of X-radiation used in crystallography are introduced, including synchrotron radiation, as well as a systematic review of detectors for X-rays and basic instruments for single crystal and powder diffractometry. The principles of the diffraction experiment are discussed and related to their practical application with a comparative description of different scan procedures. Diffraction data collection and processing are also reviewed and methods for error correction are described. This book will provide a useful guide for researchers and students starting in this area of science, as well as skilled crystallographers.

Synopsis:

This up-to-date resource on X-ray diffraction instruments presents the different sources of X-rays used in crystallography and gives a systematic review of detectors for X-rays and of basic instruments for single crystal and powder diffractometry.

Table of Contents

1. Radiation used in Crystallography

2. Principle of the Diffraction Experiment

3. Fundamental Techniques for X-ray Diffractometry

4. Single-crystal X-ray Diffractometry

5. Single Crystal Diffraction Data Collection and primary Processing

6. Primary Data Reduction and Error Correction in Single-Crystal Diffractometry

7. Defects in Crystals and their Influence on X-ray Structure Analysis

8. Auxiliary Methods

References

Subject Index

1. Radiation used in Crystallography

2. Principle of the Diffraction Experiment

3. Fundamental Techniques for X-ray Diffractometry

4. Single-crystal X-ray Diffractometry

5. Single Crystal Diffraction Data Collection and primary Procesing

6. Primary Data Reduction and Error Correction in Single-Crystal Diffractometry

7. Defects in Crystals and their Influence on X-ray Structure Analysis

8. Auxiliary Methods

References

Subject Index

Product Details

ISBN:
9780198559276
Author:
Aslanov, L. A.
Publisher:
Oxford University Press, USA
Author:
Howard, J. A. K.
Author:
Fetisov, G. V.
Location:
Chester, England :
Subject:
Crystallography
Subject:
Chemistry | Biological Chemistry | Crystallography
Subject:
X-ray crystallography -- Instruments.
Subject:
Chemistry - Industrial & Technical
Subject:
General
Subject:
Physics-Crystallography
Edition Number:
revised
Edition Description:
genuine leather black 7614
Series:
International Union of Crystallography Monographs on Crystallography
Series Volume:
7
Publication Date:
19980731
Binding:
HARDCOVER
Grade Level:
College/higher education:
Language:
English
Illustrations:
13 pt. type
Pages:
328
Dimensions:
9.3 x 6.2 x 0.9 in 1.4 lb

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Product details 328 pages Oxford University Press, Incorporated - English 9780198559276 Reviews:
"Synopsis" by , This up-to-date resource on X-ray diffraction instruments presents the different sources of X-rays used in crystallography and gives a systematic review of detectors for X-rays and of basic instruments for single crystal and powder diffractometry.
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