Poetry Madness
 
 

Recently Viewed clear list


Q&A | February 27, 2014

Rene Denfeld: IMG Powell’s Q&A: Rene Denfeld



Describe your latest book. The Enchanted is a story narrated by a man on death row. The novel was inspired by my work as a death penalty... Continue »
  1. $18.19 Sale Hardcover add to wish list

    The Enchanted

    Rene Denfeld 9780062285508

spacer
$202.08
New Hardcover
Ships from International Warehouse (read more)
Add to Wishlist
available for shipping only
Not available for In-store Pickup
Qty Store Section
1 International Warehouse Engineering- General Engineering

An Introduction to Mixed-Signal IC Test and Measurement (Oxford Series in Electrical and Computer Engineering)

by

An Introduction to Mixed-Signal IC Test and Measurement (Oxford Series in Electrical and Computer Engineering) Cover

 

  1. This particular item is stocked in an International Warehouse and will ship separately from other items in your shopping cart.

Synopses & Reviews

Publisher Comments:

Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. However, test engineering is still a relatively unknown profession compared to IC design engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many textbooks have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement.

An Introduction to Mixed-Signal IC Test and Measurement is a textbook for advanced undergraduate and graduate-level students as well as engineering professionals. It was written in response to the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary.

This text encompasses the testing of both analog and mixed-signal circuits including many borderline examples. Digital testing is covered, but not as extensively because of the wealth of information on this topic already available. Examples and illustrations using state-of-the-art industrial technology enrich and enliven the presentation throughout. In considering the applications of this technology, the testing of large-scale mixed-signal circuits and individual circuits is introduced. The value-added benefits of mixed-signal IC testing to a manufacturer's product are clearly discussed, and the role of the test engineer is clearly defined.

Table of Contents

Chapter 1: Overview of Mixed-Signal Testing

1.1. Mixed-Signal Ciruits

1.2. Why Test Mixed-Signal Devices

1.3. Post-Silicon Production Flow

1.4. Test and Diagnostic Equipment

1.5. New Product Development

1.6. Mixed-Signal Testing Challenges

Chapter 2: The Test Specification Process

2.1. Device Data Sheets

2.2. Generating the Test Plan

2.3. Components of a Test Program

2.4. Summary

Chapter 3: DC and Parametric Measurements

3.1. Continuity

3.2. Leakage Currents

3.3. Power Supply Currents

3.4. DC References and Regulators

3.5. Impedance Measurements

3.6. DC Offset Measurements

3.7. DC Gain Measurements

3.8. DC Power Supply Rejection Ratio

3.9. DC Common Mode Rejection Ratio

3.10. Comparator DC Tests

3.11. Voltage Search Techniques

3.12. DC Tests for Digital Circuits

3.13. Summary

Chapter 4: Measurement Accuracy

4.1. Terminology

4.2. Calibrations and Checkers

4.3. Dealing with Measurement Error

4.4. Basic Data Analysis

4.5. Summary

Chapter 5: Tester Hardware

5.1. Mixed-Signal Tester Overview

5.2. DC Resources

5.3. Digital Subsystem

5.4. AC Source and Measurement

5.5. Time Measurement System

5.6. Computing Hardware

5.7. Summary

Chapter 6: Sampling Theory

6.1. Analog Measurements Using DSP

6.2. Sampling and Reconstruction

6.3. Repetitive Sample Sets

6.4. Synchronization of Sampling Systems

6.5. Summary

Chapter 7: DSP-Based Testing

7.1. Advantages of DSP-Based Testing

7.2. Digital Signal Processing

7.3. Discrete-Time Transforms

7.4. The Inverse FFT

7.5. Summary

Chapter 8: Analog Channel Testing

8.1. Overview

8.2. Gain and Level Tests

8.3. Phase Tests

8.4. Distortion Tests

8.5. Signal Rejection Tests

8.6. Noise Tests

8.7. Simulation of Analog Channel Tests

8.8. Summary

Chapter 9: Sampled Channel Testing

9.1. Overview

9.2. Sampling Considerations

9.3. Encoding and Decoding

9.4. Sampled Channel Tests

9.5. Summary

Chapter 10: Focused Calibrations

10.1. Overview

10.2. DC Calibrations

10.3. AC Amplitude Calibrations

10.4. Other AC Calibrations

10.5. Error Cancellation Techniques

10.6. Summary

Chapter 11: DAC Testing

11.1. Basics of Converter Testing

11.2. Basic DC Tests

11.3. Transfer Curve Tests

11.4. Dynamic DAC Tests

11.5. DAC Architectures

11.6. Summary

Chapter 12: ADC Testing

12.1. ADC Testing Versus DAC Testing

12.2. ADC Code Edge Measurements

12.3. DC Tests and Transfer Curve Tests

12.4. Dynamic ADC Tests

12.5. ADC Architectures

12.6. Tests for Common ADC Applications

12.7. Summary

Chapter 13: DIB Design

13.1. DIB Basics

13.2. Printed Circuit Boards (PCBS)

13.3. DIB Traces, Shields, and Guards

13.4. Transmission Lines

13.5. Grounding and Power Distribution

13.6. DIB Components

13.7. Common DIB Circuits

13.8. Common DIB Mistakes

13.9. Summary

Chapter 14: Design for Test (DfT)

14.1. Overview

14.2. Advantages of DfT

14.3. Digital Scan

14.4. Digital BIST

14.5. Digital DfT for Mixed-Signal Circuits

14.6. Mixed-Signal Boundary Scan and BIST

14.7. Ad Hoc Mixed-Signal DfT

14.8. Subtle Forms of Analog DFT

14.9. IDDQ

14.10. Summary

Chapter 15: Data Analysis

15.1. Introduction to Data Analysis

15.2. Data Visualization Tools

15.3. Statistical Analysis

15.4. Statistical Process Control (SPC)

15.5. Summary

Chapter 16: Test Economics

16.1. Profitability Factors

16.2. Direct Testing Costs

16.3. Debugging Skills

16.4. Emerging Trends

16.5. Summary

Product Details

ISBN:
9780195140163
Author:
Burns, Mark
Author:
Roberts, Gordon W.
Author:
Burns, Mark
Author:
null, Mark
Author:
null, Gordon W.
Publisher:
Oxford University Press, USA
Location:
New York
Subject:
Engineering - Electrical & Electronic
Subject:
Engineering
Subject:
Electronics - Circuits - Integrated
Subject:
Mensuration
Subject:
Computer Engineering
Subject:
Testing
Subject:
Integrated circuits
Subject:
Engineering / Electrical
Subject:
Technology | Electrical
Subject:
Electricity
Subject:
Engineering and Technology | Electrical and Computer Engineering
Subject:
Integrated circuits -- Testing.
Subject:
Mixed signal circuits -- Testing.
Subject:
Engineering & Technology | Electrical & Computer Engineering
Subject:
Electricity-General Electricity
Edition Description:
Hardcover
Series:
The Oxford series in electrical and computer engineering
Series Volume:
00-018
Publication Date:
20001214
Binding:
Hardback
Grade Level:
College/higher education:
Language:
English
Illustrations:
375 line illus, and halftones
Pages:
704
Dimensions:
7.5 x 9.2 x 1.5 in 3.05 lb

Related Subjects

History and Social Science » Geography » General
History and Social Science » Politics » General
Science and Mathematics » Electricity » General Electronics

An Introduction to Mixed-Signal IC Test and Measurement (Oxford Series in Electrical and Computer Engineering) New Hardcover
0 stars - 0 reviews
$202.08 In Stock
Product details 704 pages Oxford University Press - English 9780195140163 Reviews:
spacer
spacer
  • back to top
Follow us on...




Powell's City of Books is an independent bookstore in Portland, Oregon, that fills a whole city block with more than a million new, used, and out of print books. Shop those shelves — plus literally millions more books, DVDs, and gifts — here at Powells.com.