Synopses & Reviews
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.
Describing practical modeling and characterization techniques for designing reliable electrical circuits, this volume includes a thorough presentation of robust designs for major VLSI units. Its first-principle simulations aid physical understanding.
Table of Contents
Atomistic simulations of reliability.- Physical mechanisms of aging effects.- Noise and aging effects.- Radiation effects.- Compact modeling of device and circuit reliability.- On-chip characterization of circuit reliability.- Circuit resilience roadmap.- Circuit layout for reliability.- Robust memory design under variation and aging effects.- Reliable design under low-frequency noise.- Variability Aware Clock Design.- Radiation Tolerance Techniques.- Thermal effects compensation.- Scaling trends and conclusion.