Synopses & Reviews
Providing a theoretical background for inorganic mass spectrometry, this text describes classical applications of four modern mass spectrometers - magnetic sector, quadrupole, time-of-flight, and ion trap - and illustrates how they have impacted elemental and isotopic analysis. The book features examples that concentrate on routine and non-routine applications of inorganic analysis techniques.
Twelve contributions describe the fundamental operating characteristics of the most common inorganic mass spectrometers. At the center of discussion is a description of the various ionization sources that generate a representative analyte population for mass analysis. The initial chapters introduce the mass spectrometric hardware that separates the ionized fractions of analytes, one mass from another. The detection schemes used to measure this ion population, and the data processing systems that permit this information to be of value to the chemist analyst, are also discussed. A brief introduction is provided to four types of modern mass spectrometers -- magnetic sector, quadrupole, time-of- flight, or ion trap. Classical applications are discussed to illustrate how these devices have shaped the landscape of elemental and isotopic chemical analysis.
Table of Contents
Thermal ionization mass spectrometry / David H. Smith -- Glow discharge mass spectrometry / Christopher M. Barshick -- Inductively coupled plasma mass spectrometry / John W. Olesik -- Secondary ion mass spectrometry / Stephen S. Cristy -- Isotope dilution mass spectrometry / David H. Smith -- The emission of ions from high-temperature condensed phase materials / James E. Delmore -- Analysis of nonconductive sample types by glow discharge mass spectrometry / R. Kenneth Marcus -- Multiple-collector inductively coupled plasma mass spectrometry / Alex N. Halliday ... et al. -- Ion traps and their application to elemental analysis / Douglas C. Duckworth, John R. Eyler, and Clifford H. Watson -- Elemental speciaton by inorganic mass spectrometry / Karen L. Sutton, Kathryn L. Ackley, and Joseph A. Caruso -- Geological applications of secondary ion mass spectrometry / Lee R. Riciputi -- Inorganic time-of-flight mass spectrometry / David P. Myers, Steven J. Ray, and Gary M. Hieftje.