Synopses & Reviews
From the reviews . . ."The first edition of this book, published 30 years ago by Duda and Hart, has been a defining book for the field of Pattern Recognition. Stork has done a superb job of updating the book. He has undertaken a monumental task of sifting through 30 years of material in a rapidly growing field and presented another snapshot of the field, determining what will be of importance for the next 30 years and incorporating it into this second edition. The style is easy to read as in the original book and the statistical, mathematical material comes alive with many new illustrations. The end result is harmonious, leading the reader through many new topics..."
–Sargur N. Srihari, PhD, Director, Center for Excellence in Document Analysis and Recognition, Distinguished Professor, Department of Computer Science and Engineering, SUNY at Buffalo
Practitioners developing or investigating pattern recognition systems in such diverse application areas as speech recognition, optical character recognition, image processing, or signal analysis, often face the difficult task of having to decide among a bewildering array of available techniques. This unique text/professional reference provides the information you need to choose the most appropriate method for a given class of problems, presenting an in-depth, systematic account of the major topics in pattern recognition today. A new edition of a classic work that helped define the field for over a quarter century, this practical book updates and expands the original work, focusing on pattern classification and the immense progress it has experienced in recent years. Special features include:
- Clear explanations of both classical and new methods, including neural networks, stochastic methods, genetic algorithms, and theory of learning
- Over 350 high-quality, two-color illustrations highlighting various concepts
- Numerous worked examples
- Pseudocode for pattern recognition algorithms
- Expanded problems, keyed specifically to the text
- Complete exercises, linked to the text
- Algorithms to explain specific pattern-recognition and learning techniques
- Historical remarks and important references at the end of chapters
- Appendices covering the necessary mathematical background
NOTE: Computer Manual in MATLAB to Accompany Pattern Classification, 2e users access toolbox via ftp://ftp.wiley.com/public/sci_tech_med/pattern_classification/ (Note: Visitors will require a password from the Manual to access.)
Review
"…it provides a good introduction to the subject of Pattern Classification." (
Journal of Classification, September 2007)
"…a fantastic book! The presentation...could not be better, and I recommend that future authors consider…this book as a role model." (Journal of Statistical Computation and Simulation, March 2006)
"...strongly recommended both as a professional reference and as a text for students..." (Technometrics, February 2002)
"...provides information needed to choose the most appropriate of the many available technique for a given class of problems." (SciTech Book News, Vol. 25, No. 2, June 2001)
"I do not believe anybody wishing to teach or do serious work on Pattern Recognition can ignore this book, as it is the sort of book one wishes to find the time to read from cover to cover!" (Pattern Analysis & Applications Journal, 2001)
"This book is the unique text/professional reference for any serious student or worker in the field of pattern recognition." (Mathematical Reviews, Issue 2001k)
"...gives a systematic overview about the major topics in pattern recognition, based whenever possible on fundamental principles." (Zentralblatt MATH, Vol. 968, 2001/18)
"attractively presented and readable" (Journal of Classification, Vol.18, No.2 2001)
Synopsis
The first edition, published in 1973, has become a classic reference in the field. Now with the second edition, readers will find information on key new topics such as neural networks and statistical pattern recognition, the theory of machine learning, and the theory of invariances. Also included are worked examples, comparisons between different methods, extensive graphics, expanded exercises and computer project topics.
An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Synopsis
Introduction to Mathematical Techniques in Pattern Recognition by Harry C. Andrews This volume is one of the first cohesive treatments of the use of mathematics for studying interactions between various recognition environments. It brings together techniques previously scattered throughout the literature and provides a concise common notation that will facilitate the understanding and comparison of the many aspects of mathematical pattern recognition. The contents of this volume are divided into five interrelated subject areas: Feature Selection, Distribution Free Classification, Statistical Classification, Nonsupervised Learning, and Sequential Learning. Appendices describing specific aspects of feature selection and extensive reference and bibliographies are included. 1972 253 pp. Threshold Logic and its Applications by Saburo Muroga This is the first in-depth exposition of threshold logic and its applications using linear programming and integer programming as optimization tools. It presents threshold logic as a unified theory of conventional simple gates, threshold gates and their networks. This unified viewpoint explicitly reveals many important properties that were formerly concealed in the framework of conventional switching theory (based essentially on and, or and not gates). 1971 478 pp. Knowing and Guessing A Quantitative Study of Inference and Information By Satosi Watanabe This volume presents a coherent theoretical view of a field now split into different disciplines: philosophy, information science, cybernetics, psychology, electrical engineering, and physics. The target of investigation is the cognitive process of knowing and guessing. In contrast to traditional philosophy, the approach is quantitative rather than qualitative. The study is formal in the sense that the author is not interested in the contents of knowledge or the physiological mechanism of the process of knowing. "The authors style is lucid, his comments are illuminating. The result is a fascinating book, which will be of interest to scientists in many different fields." Nature 1969 592 pp.
Synopsis
Pattern Classification and Scene Analysis By Richard O. Duda and Peter E. Hart Here is a unified, Comprehensive, and up-to-date treatment of the theoretical principles of pattern recognition. These principles are applicable to a great variety of problems of current interest, such as character recognition, speech recognition, speaker identification, fingerprint recognition, the analysis of biomedical photographs, aerial photoreconnaissance, automatic inspection for industrial quality control, and visual systems for robots. Throughout Pattern Classification and Scene Analysis, the authors have balanced their presentation to reflect the relative importance of the many theoretical topics in the field. Pattern Classification and Scene Analysis is the first book to provide comprehensive coverage of both statistical classification theory and computer analysis of pictures. Part I covers Bayesian decision theory, supervised and unsupervised learning, nonparametric techniques, discriminant analysis, and clustering. Part II describes many techniques of current interest in automatic scene analysis, including preprocessing of pictorial data, spatial filtering, shape-description techniques, perspective transformations, projective invariants, linguistic procedures, and artificial intelligence techniques for scene analysis. Although the theories and techniques of pattern recognition are largely mathematical, the authors have been more concerned with providing insight and understanding than with establishing rigorous mathematical foundations. The many illustrative examples, plausibility arguments, and discussions of the behavior of solutions reflect this concern. Extensive bibliographical and historical remarks at the end of each chapter further enhance the presentation. Standard notation is used wherever possible, and a comprehensive index is included. Typical first-year graduate students will find most of the mathematical arguments well within their grasp. Because the exposition is clear and balanced, Pattern Classification and Scene Analysis is suitable for both college and professional use. In particular, it will appeal to graduate students and professionals in the fields of computer science, electrical engineering, and statistics. Students and professionals in psychology, biomedical science, meteorology, and biology will also find it of value for the light it sheds on such areas as visual perception, image processing, and numerical taxonomy.
About the Author
About the Authors RICHARD O. DUDA is a Senior Research Engineer at Stanford Research Institute. He received a Ph. D. degree in Electrical Engineering from the Massachusetts Institute of Technology in 1962. Dr. Duda was the Associate Editor for "Pattern Recognition: IEEE Transactions on Computers" from 1969 to 1971. He has lectured on pattern classification at the University of California, Berkeley, and has written numerous technical articles for journals and books. PETER E. HART is Assistant Director of the Artificial Intelligence Center at Stanford Research Institute. He received a Ph. D. degree in Electrical Engineering from Stanford University in 1966. Dr. Hart has lectured on scene analysis at Stanford University, and has actively contributed to the literature of pattern recognition and artificial intelligence.
Table of Contents
PATTERN CLASSIFICATION.
Bayes Decision Theory.
Parameter Estimation and Supervised Learning.
Nonparametric Techniques.
Linear Discriminant Functions.
Unsupervised Learning and Clustering.
SCENE ANALYSIS.
Representation and Initial Simplifications.
The Spatial Frequency Domain.
Descriptions of Line and Shape.
Perspective Transformations.
Projective Invariants.
Descriptive Methods in Scene Analysis.
Author and Subject Indexes.