Synopses & Reviews
Describes new methods for optical characterization of crystals as well as for supplementing more conventional methods for determination of crystal structures.
Table of Contents
Preface; 1. Operational and plotting techniques; 2. Examination of uniaxial crystals; 3. Examination of biaxial crystals; 4. Index variation methods and extrapolation; 5. Index measurements: accuracy, precision, and techniques; 6. Computer determination of 2V and of X, Y, and Z and their dispersion; 7. Combined optical and X-ray studies of crystals; 8. calculating principal birefringences (and 2V) from retardation measurements; 9. Epilogue and applications; Appendixes; Answers to questions and problems; Notes; References; Index.