Synopses & Reviews
THE LATEST PACKAGING SOLUTIONS FOR QUANTUM-WELL LASERSThis groundbreaking reference presents state-of-the-art packaging techniques for high-power quantum-well laser arrays. These devices, with continuous-wave emission powers of several hundred watts, represent the most effective converters from electric energy into light ever created. Edited by two leading experts in the field, Quantum-Well Laser Array Packaging covers all critical issues related to material packaging problems and includes unique screening and packaging techniques not found in any other resource.
- Get a complete overview of quantum-well laser diode array degradation
- Examine innovative methods of strain measurement
- Learn new imaging techniques for laser facet inspection
- Explore promising directions in screening and failure prediction
- Discover improved packaging techniques for reducing external stresses
- Review current research on degradation modes and related defects in high-power laser bars
INSIDE Quantum-Well Laser Array PackagingOverview of Laser Diode Degradation Mechanisms • Strain Measurement • Laser Facet Inspection by Imaging Techniques • Failure Prediction of High-Power Laser Bars • Reduction of External Stresses by Improved Packaging Techniques • Degradation Modes and Related Defects in High-Power Laser Bars
Synopsis
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The very latest nanoscale packaging techniques needed to keep quantum-well lasers functioning
In this book the authors address the nanoscale packaging issue by providing you with state-of-the-art screening and packaging techniques not found in any other resource.
About the Author
Jens W. Tomm (Berlin, Germany) is currently on the scientific staff of the Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie where he serves as project leader. His work is focused on spectroscopic aging analysis of high-powered diode lasers, optical spectroscopy in such optoelectronic devices as high-powered semiconductor lasers, thermal analysis of optoelectronic devices by means of Raman-spectroscopy and Microthermography, device-related near-field scanning optical microscopy (NSOM) and Fourier-Transform (FT) spectroscopy, transient photoluminescence spectroscopy in III-V semiconductors/structures, and optoelectronic device development, and IR-LEDs for the 3-5 µm spectral range.
Juan Jiménez (Valladolid, Spain) is a Full Professor at the University of Valladolid, RandD where as group leader, he researches optical characterization of semiconductors and devices using microscopic techniques. His research has been carried out in the frame of different academic and industrial projects around the world and funded by such institutions as the Spanish government, European Union, EOARD (European Office for Aerospace Research and Development), Alcatel Optronics, and Avanex among others.
Table of Contents
ContributorsForewordChapter 1: IntroductionChapter 2: Overview of Laser Diode Degradation MechanismsChapter 3: Strain MeasurementChapter 4: Laser Facet Inspection by Imaging TechniquesChapter 5: Failure Prediction of High-Power Laser BarsChapter 6: Reduction of External Stresses by Improved Packaging TechniquesChapter 7: Degradation Modes and Related Defects in High-Power Laser BarsChapter 8: SummaryAPPENDIX: MATERIALS PROPERTIESIndex