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Testing and Reliable Design of CMOS Circuits
by
Niraj K. Jha
and
Sandip Kundu
Comment on this title
ISBN13:
9780792390565
ISBN10:
0792390563
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Product Details
ISBN:
9780792390565
Binding:
Hardcover
Publication date:
12/31/1989
Publisher:
Springer
Series info:
Kluwer International Series in Engineering & Computer Science
Language:
English
Pages:
232
Height:
.63IN
Width:
6.14IN
LCCN:
89-37031
Series:
Kluwer International Series in Engineering & Compu
Series Number:
88
Number of Units:
1
Copyright Year:
1989
Series Volume:
bk. 1SECS 88.
UPC Code:
2800792390567
Author:
Niraj K Jha
Author:
Niraj K. Jha
Author:
Sandip Kundu
Subject:
Metal oxide semiconductors, Complementary
Subject:
Integrated circuits
Subject:
Integrated circuits -- Very large scale integration -- Design and construction.
Subject:
Testing
Subject:
Metal oxide semiconductors, Complementary -- Testing.
Subject:
Computer-Aided Engineering (CAD, CAE) and Design
Subject:
Electrical engineering
Subject:
Engineering-General Engineering
$203.95
New Hardcover
Available at a Remote Warehouse. Ships separately from other items. Additional shipping charges may apply. Not available for In Store Pickup.
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Remote Warehouse
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This title in other editions
New, Trade Paperback, $203.95
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