Synopses & Reviews
This unique and innovative laboratory manual helps users learn and understand circuit analysis concepts by using Electronic Workbench software to simulate actual laboratory experiments on a computer. Learners work with circuits drawn on the computer screen and with simulated instruments that act like actual laboratory instruments. Circuits can be modified easily with on-screen editing, and analysis results provide fast, accurate feedback. “Hands-on” in approach throughoutin both interactive experiments and a series of questions about the results of each experimentit is more cost effective, safer, and more thorough and efficient than using hardwired experiments. This For use with any DC/AC text.
Table of Contents
Introduction.
PART I. COMBINATIONAL LOGIC CIRCUITS.
Experiment 1. Preliminary Concepts.
Experiment 2. Logic Gates: INVERTER, OR, and AND.
Experiment 3. Logic Gates: NAND and NOR.
Experiment 4. Boolean Theorems—DeMorgan’s Theorems.
Experiment 5. Universality of NAND and NOR Gates.
Experiment 6. Analyzing Combinational Logic Circuits.
Experiment 7. Simplifying Combinational Logic Circuits.
Experiment 8. Logic Simplification Using Karnaugh Maps.
Experiment 9. Designing Combinational Logic Circuits.
Experiment 10. Troubleshooting Combinational Logic Circuits.
PART II. ARITHMETIC LOGIC CIRCUITS.
Experiment 11. Logic Gates: XOR and XNOR.
Experiment 12. Arithmetic Circuits.
Experiment 13. Parallel Binary Adder.
Experiment 14. BCD Adder.
Experiment 15. Parity Generator/Checker.
Experiment 16. Magnitude Comparator.
Experiment 17. Troubleshooting Arithmetic Circuits.
PART III. MSI LOGIC CIRCUITS.
Experiment 18. Decoders and Encoders.
Experiment 19. Multiplexers and Demultiplexers.
Experiment 20. Troubleshooting MSI Logic Circuits.
PART IV. SEQUENTIAL LOGIC CIRCUITS.
Experiment 21. S-R and D Latches.
Experiment 22. Edge-Triggered Flip-Flops.
Experiment 23. Monostable and Astable Multivibrators.
Experiment 24. Registers and Data Storage.
Experiment 25. Asynchronous Counters.
Experiment 26. Synchronous Counters.
Experiment 27. BCD Counters.
Experiment 28. Troubleshooting Sequential Logic Circuits.
PART V. INTERFACING THE ANALOG WORLD.
Experiment 29. Digital-to-Analog Converters.
Experiment 30. Analog-to-Digital Converters.
Experiment 31. Data Acquisition.
Appendix A: IC Chip Pin Diagrams.
Appendix B: Notes on Using Electronics Workbench Multisim.
Bibliography.