Synopses & Reviews
Traditional and newly emerging topics of research in the field of phonon scattering and heat transport are covered by the contributions to this volume. They present in-depth information on phonon scattering in glassy andcrystalline dielectrics, semiconductors, and normal and superconducting metals. Written by active researchers in the field, the book provides an up-to-date overview on phonon imaging, surfaces and interfaces, particle detection, optical techniques, and new experimental methods. Scientists and graduate students find the most valuable informationon lattice dynamics and heat flow available to date.
Synopsis
This volume contains the proceedings of the Seventh International Conference on Phonon Scattering in Condensed Matter held August 3-7, 1992, at Cornell University in Ithaca, NY, USA. The preceding conferences were held at: St. Maxime and Paris (France) 1972, Nottingham (UK) 1975, Providence (USA) 1979, Stuttgart (Germany) 1983, Urbana (USA) 1986, and Heidelberg (Germany) 1989. The Heidelberg conference was held jointly with the Third International Con- ference on Phonon Physics. The next conference, to be held in August, 1995, in Sapporo, Japan, and hosted by Professor T. Nakayama and his colleagues, will also be such a joint conference. This conference was attended by 227 scientists from 27 countries, and covered all aspects of phonon scattering in condensed matter, ranging from the more traditional topics of thermal conductivity, Kapitza resistance, and ballistic phonon propagation to the recently added topics, such as electron-phonon interaction in high-T c superconductors, the use of phonons in particle detection, and phonons in confined geometries. The 207 papers arranged in 11 chapters in this volume are a cross section of the present activities in the quite obviously vibrant field of phonons and their interactions.
Synopsis
The active and rapidly growing field of materials science and condensed matter research is highlighted in terms of phonon scattering. Special emphasis is placed on glassy and crystalline dielectrics, semiconductors, and normal and superconducting metals.