Table of Contents
A Perspective on the Analysis of Surfaces and Interfaces (M. Seah & D. Briggs).
Instrumentation (J. Rivi?re).
Spectral Interpretation (D. Briggs & J. Rivi?re).
Depth Profiling in AES and XPS (S. Hofmann).
Quantification of AES and XPS (M. Seah).
Applications of AES in Microelectronics (D. Harris & R. Nowicki).
AES in Metallurgy (M. Seah).
Applications of Electron Spectroscopy to Heterogeneous Catalysis (T. Barr).
Applications of XPS in Polymer Technology (D. Briggs).
Uses of Auger Electron and Photoelectron Spectroscopies in Corrosion Science (N. McIntyre & T. Chan).
Appendices.
Index.