Synopses & Reviews
Volume 2 in this key series reviews the newest applications and techniques related to high resolution acoustic imaging. Chapters describe uses of the acoustic microscope in semiconductor research; a phase-sensitive acoustic microscope; and applications of digital time-reversal mirrors, among other topics. The text is illustrated with 275 halftones, line drawings, and tables. Like its predecessor, this new volume is an invaluable resource for researchers in engineering, materials science, physics, and biology who wish to learn about developments in this burgeoning field.
Review
`An outstanding work.' The Journal of Scanning Microscopies, January 1998 `Very well written and illustrated...the subjects selected are of major importance and...the editors (and the authors) have perfomed an outstanding work in presenting in the same volume both fundamental studies and medical or industrial applications.' Scanning, 1998
Synopsis
This is the second volume of Advances in Acoustic Microscopy. It continues the aim of presenting applications and developments of techniques that are related to high-resolution acoustic imaging. We are very grateful to the authors who have devoted considerable time to preparing these chapters, each of which describes a field of growing importance. Laboratories that have high-performance acoustic microscopes are frequently asked to examine samples for which the highest available resolution is not necessary, and the ability to penetrate opaque layers is more significant. Such applications can be thought of as bridging the gap be- tween acoustic microscopy at low gigahertz frequencies, and on the one hand nondestructive testing of materials at low megahertz frequencies and on the other hand medical ultrasonic imaging at low megahertz frequencies. Commercial acoustic microscopes are becoming increasingly available and popular for such applications. We are therefore delighted to be able to begin the volume with chapters from each of those two fields. The first chapter, by Gabriele Pfannschmidt, describes uses of acoustic microscopy in the semiconductor industry. It provides a splendid balance to the opening chapter of Volume 1, which came from a national research center, being written from within a major European electronics industry itself. Dr Pfann- schmidt describes the use of two quite different types of acoustic microscopes, and points out the advantages of each for specific purposes.
Table of Contents
Characterization of Electronic Components by Acoustic Microscopy; G. Pfannschmidt. Interaction of Acoustic Waves with Solid Surfaces; Y. Tsukahara, et al. Scanning Acoustic Microscopy with Phase Contrast; W. Grill, et al. Ultrasonic Focusing with Time Reversal Mirrors; M. Fink, C. Prada.