Synopses & Reviews
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Synopsis
Combining theory with practical examples, this volume presents a comprehensive overview of logic circuits. The text presents techniques used to analyze, design and test logic circuits with probabilistic behavior, and provides a multidisciplinary approach to uncertainty.
Synopsis
Integrated circuits (ICs) are becoming increasingly susceptible to uncertainty caused by soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits. In order to address this issue, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects.
Synopsis
Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.
Table of Contents
Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis during Design.- Design for Robustness.- Discussion.