Synopses & Reviews
This book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the first edition, published in 1975, which was regarded as a standard work on the subject.\[P\] The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers are covered in the first part. Experimental procedures for qualitative analysis (including elemental mapping) and quantitative design analysis, using both types of spectrometer, are then discussed. Matrix (\'2AF\') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of \'light\' elements (atomic number below 10) are covered in a separate chapter. There is also an appendix dealing with the physics of X-ray production that includes a number of useful tables. The emphasis throughout is on a sound understanding of principles; the treatment is applicable equally to the electron microbe in its \'classical\' form and to scanning electron microbes fitted with X-ray spectrometers. The book is aimed at those with a serious interest in using and understanding the technique, including graduate students and others in fields such as materials science and mineralogy, as well as those in industrial environments. It is suitable for users of scanning electron microscopes fitted with X-ray spectrometers as well as electron microprobes.
Synopsis
Paperback of successful physics monograph on electron microprobe analysis, a widely used technique.
Synopsis
This 1993 book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.
Description
Includes bibliographical references (p. 306-318) and index.
Table of Contents
1. Introduction; 2. Essential features of the electron microprobe; 3. Electron gun; 4. The probe-forming system; 5. Scanning; 6. Wavelength-dispersive spectrometers; 7. Proportional counters; 8. Counting electronics; 9. Lithium-drifted silicon detectors; 10. Electronics for energy-dispersive systems; 11. Wavelength-dispersive analysis; 12. Energy-dispersive analysis; 13. X-ray generation and stopping power; 14. Electron backscattering; 15. Absorption corrections; 16. Fluorescence corrections; 17. Matrix corrections in practice; 18. Light element analysis; Appendix: origin of characteristic X-rays.