Synopses & Reviews
High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.
Synopsis
Materials Science Electron microscopists, researchers, graduate students
Table of Contents
Basis of Transmission Electron Microscopy: Principles of Transmission Electron Microscopy. Electron Scattering and Fourier Transformation. Formation of High-Resolution Electron Microscopy. Computer Simulation of High-Resolution Electron Microscopy.- Practice of High-Resolution Electron Microscopy: Classifications of High-Resolution Electron Microscope Images. Practice of High-Resolution Electron Microscope Observation.- Application of High-Resolution Electron Microscopy: High-Resolution Electron Microscope Images of Lattice Defects, Surface and Interface. High-Resolution Electron Microscope Images of Various Materials. Peripheral Instruments and Techniques for High-Resolution Electron Microscopy: Image Processing. Quantitative Analysis. Electron Diffraction. Weak Beam Technique. Evaluation of Characteristic Parameters of Electron Microscopes. Specimen Preparation Techniques.- Appendix.