Synopses & Reviews
The second edition of this successful textbook provides a clear, well-written introduction to the principal techniques used in surface analysis, together with the computational methods used to interpret the increasingly complex data generated by them. Coverage includes the basic theory and practice of each technique together with practical examples of its sue and application and most chapters include review questions enabling the reader to develop and test their understanding.
Includes the following new material:
- A completely new chapter on 'Dynamic SIMS'
- A completely new chapter on 'The Application of Multivariate Data Analysis Techniques in Surface Analysis'
- All the other chapters have been extensively revised. Many now include illustrative applications and development room the fields of biotechnology and nanotechnology.
Surface Analysis - the Principal Techniques 2nd Edition, will be appropriate for the scientifically literate lay-person and for use in specialist undergraduate courses in materials and analytical sciences. Post-graduate M.Sc. and Ph.D. students involved in surface analysis and research whether concerned with inorganic, organic or biological materials will find it particularly useful. In addition, industrial analytical scientists will find this book an invaluable introduction to bring rapid familiarity with the capabilities of the various techniques.
Thus this book should be of value to those who need to have a wide overview of the techniques in education or in industrial quality control or R&D laboratories. For those who wish to further develop their knowledge and practice or particular techniques, it should also give a good basic understanding from which to build.
Synopsis
This completely updated and revised second edition of
Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis.
Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.
Synopsis
Die Theorie und Praxis der Oberfl chenanalyse wird von Experten mehrerer Fachgebiete erl utert. Dadurch wird der Leser in die Lage versetzt, Ergebnisse und Datenreihen zu verstehen und umzusetzen.
Synopsis
Internationally there is a growing number of professionals administering psychological tests by computer. Computer Based Testing and The Internet highlights four main themes that define current issues, technical advances and applications: advances in computer based testing, including test designs; operational issues, including security and legal issues; new uses for tests in employment and credentialing; and future of computer based testing. Each contributor addresses issues of control, quality, security and technology within the subject matter of their particular chapters providing an excellent overview.
Synopsis
No topic is more central to innovation and current practice in testing and assessment today than computers and the Internet. This timely publication highlights for main themes that define current issues, technical advances and applications of computer-based testing.
- Advances in computer-based testing-new test designs, item selection algorithms, exposure control issues and methods, and new tests that capitalize on the power of computer technology.
- Operation issues-systems design, test security, and legal and ethical matters.
- New and improved uses-for tests in employment and credentialing.
- The future of computer-based testing-identifying potential issues, developments, major advances and problems to overcome.
Written by internationally recognized contributors, each chapter focuses on issues of control, quality, security and technology. These issues provide the basic structure for the International Test Commission's new Guidelines on Computer-Based Testing and Testing on the Internet. the contributions to this book have played a key role in the development of these guidelines.
Computer-Based Testing and the internet is a comprehensive guide for all professionals, academics and practitioners working in the fields of education, credentialing, personnel testing and organizational assessment. It will also be of value of students developing expertise in these areas.
About the Author
Dave Bartram is Past President of the International Test commission and is heading ITC projects on international guidelines for standards in test use and standards for computer-based testing and the Internet. He is Chair of the British Psychological Society's Steering Committee on Test Standards and Convenor of the European Federation of Psychologists' Associations Standing Committee on Tests and Testing. He is President-Elect of the IAAP's Division 2.
Professor Bartram is Research Director for SHL Group plc. Prior to his appointment with SHL in 1998, he was Dean of the Faculty of Science and the Environment, and Professor of Psychology in the Department of Psychology at the University of Hull. He is a Chartered Occupational Psychologist, a Fellow of the British Psychological Society (BPS) and a Fellow of the Ergonomics Society. In 2004 he received the BPS award for Distinguished Contributions to Professional Psychology. His specialist area is computer-based testing and Internet assessment systems. Within SHL he is leading the development of their next generation of Internet-based delivery systems and the development of a multi-dimensional generic Competency Framework.
He has published large numbers of popular, professional and academic articles and book chapters, and has been the Senior Editor of the BPS Test Reviews. He has been an editor or co-author of several works including the 1992, 1995 and 1997 BPS Reviews of Psychometric Tests; Organisational Effectiveness: the Role of Psychology (with Ivan Robertson and Militza Callinan, published in 2002 by Wiley)and the BPS Open Learning Programme for Level A (Occupational) Test Use (with Pat Lindley, published by BPS Blackwell in 1994.
Ronald K. Hambleton holds the title of Distinguished University Professor and is Chairperson of the research and Evaluation Methods Program and Executive Director of the Center for Educational Assessment at the University of Massachusetts, Amherst, in the United States. He earned a B.A. in 1966 from the University of Waterloo in Canada with majors in mathematics and psychology, and an M.A. in 1967 and Ph.D. in 1969 from the University of Toronto with specialties in psychometric methods and statistics. Professor Hambleton teaches graduate-level courses in educational and psychological testing, item response theory and applications, and classical test theory models and methods, and offers seminar courses on applied measurement topics. He is co-author of several textbooks including (with H. Swaminathan and H. Jane Rogers) Fundamentals of Item Response Theory (published by Sage in 1991) and Item response Theory: Principles and App0licaitons (published by Kluwer in 1985), and co-editor of several books including International Perspectives on Academic Assessment ( with Thomas Oakland, published by Kluwer in 1995), Handbook of Modern Item response Theory ( with Wim van der Linden, published by Springer in 1997) and Adaptation of Educational and Psychological Tests for Cross-Cultural Assessment ( with Peter Merenda and Charles Spielberger, Published by Earlbaum in 2005). His research interests are in the areas of item response model applications to educational achievement and credentialing exams, standard-setting, test adaptation methodology, score reporting and computer-base testing. he has received several honors and awards for his more than 35 years of measurement research including honorary doctorates from Umea University in Sweden and the University of Oviedo in Spain, the 1994, National Council on Measurement in Education Career Award, the 2003Association of Test Publisher National Award for Contributions to Computer-Based Testing, and the 2005 E.F. Lindquist Award for Contributions to Assessment. Professor Hambleton is a frequent consultant to state department of education, national government agencies and credentialing organizations.
Table of Contents
List of Contributors.Preface.
1 Introduction (John C. Vickerman).
1.1 How do we Define the Surface?
1.2 How Many Atoms in a Surface?
1.3 Information Required.
1.4 Surface Sensitivity.
1.5 Radiation Effects – Surface Damage.
1.6 Complexity of the Data.
2 Auger Electron Spectroscopy (Hans Jörg Mathieu).
2.1 Introduction.
2.2 Principle of the Auger Process.
2.3 Instrumentation.
2.4 Quantitative Analysis.
2.5 Depth Profile Analysis.
2.6 Summary.
References.
Problems.
3 Electron Spectroscopy for Chemical Analysis (Buddy D. Ratner and David G. Castner).
3.1 Overview.
3.2 X-ray Interaction with Matter, the Photoelectron Effect and Photoemission from Solids.
3.3 Binding Energy and the Chemical Shift.
3.4 Inelastic Mean Free Path and Sampling Depth.
3.5 Quantification.
3.6 Spectral Features.
3.7 Instrumentation.
3.8 Spectral Quality.
3.9 Depth Profiling.
3.10 X–Y Mapping and Imaging.
3.11 Chemical Derivatization.
3.12 Valence Band.
3.13 Perspectives.
3.14 Conclusions.
Acknowledgements.
References.
Problems.
4 Molecular Surface Mass Spectrometry by SIMS (John C. Vickerman).
4.1 Introduction.
4.2 Basic Concepts.
4.3 Experimental Requirements.
4.4 Secondary Ion Formation.
4.5 Modes of Analysis.
4.6 Ionization of the Sputtered Neutrals.
4.7 Ambient Methods of Desorption Mass Spectrometry.
References.
Problems.
5 Dynamic SIMS (David McPhail and Mark Dowsett).
5.1 Fundamentals and Attributes.
5.2 Areas and Methods of Application.
5.3 Quantification of Data.
5.4 Novel Approaches.
5.5 Instrumentation.
5.6 Conclusions.
References.
Problems.
6 Low-Energy Ion Scattering and Rutherford Backscattering (Edmund Taglauer).
6.1 Introduction.
6.2 Physical Basis.
6.3 Rutherford Backscattering.
6.4 Low-Energy Ion Scattering.
Acknowledgement.
References.
Problems.
Key Facts.
7 Vibrational Spectroscopy from Surfaces (Martyn E. Pemble and Peter Gardner).
7.1 Introduction.
7.2 Infrared Spectroscopy from Surfaces.
7.3 Electron Energy Loss Spectroscopy (EELS).
7.4 The Group Theory of Surface Vibrations.
7.5 Laser Raman Spectroscopy from Surfaces.
7.6 Inelastic Neutron Scattering (INS).
7.7 Sum-Frequency Generation Methods.
References.
Problems.
8 Surface Structure Determination by Interference Techniques (Christopher A. Lucas).
8.1 Introduction.
8.2 Electron Diffraction Techniques.
8.3 X-ray Techniques.
8.4 Photoelectron Diffraction.
References.
9 Scanning Probe Microscopy (Graham J. Leggett).
9.1 Introduction.
9.2 Scanning Tunnelling Microscopy.
9.3 Atomic Force Microscopy.
9.4 Scanning Near-Field Optical Microscopy.
9.5 Other Scanning Probe Microscopy Techniques.
9.6 Lithography Using Probe Microscopy Methods.
9.7 Conclusions.
References.
Problems.
10 The Application of Multivariate Data Analysis Techniques in
Surface Analysis (Joanna L.S. Lee and Ian S. Gilmore).
10.1 Introduction.
10.2 Basic Concepts.
10.3 Factor Analysis for Identification.
10.4 Regression Methods for Quantification.
10.5 Methods for Classification.
10.6 Summary and Conclusion.
Acknowledgements.
References.
Problems.
Appendix 1 Vacuum Technology for Applied Surface Science (Rod Wilson).
A1.1 Introduction: Gases and Vapours.
A1.2 The Pressure Regions of Vacuum Technology and their Characteristics.
A1.3 Production of a Vacuum.
A1.4 Measurement of Low Pressures.
Acknowledgement.
References.
Appendix 2 Units, Fundamental Physical Constants and Conversions.
A2.1 Base Units of the SI.
A2.2 Fundamental Physical Constants.
A2.3 Other Units and Conversions to SI.
References.
Index.